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基于切片谱的错误定位框架影响因素分析
  • 摘要

    错误定位是软件调试的重要环节,基于切片谱的统计错误定位技术,借助程序切片可以提高错误定位效率.而这类技术执行效果取决于构建切片谱的切片选择策略和怀疑度计算公式的选择.为评估不同的切片选择策略及怀疑度计算公式对错误定位效率的影响,提出一种基于切片谱的错误定位框架.该框架首先计算程序执行失败时的全切片和成功时的执行切片,随后提出一组基于相似度的切片挑选策略以构建切片谱,最后按照选定的公式计算怀疑度并生成定位报告.应用提出的错误定位框架,针对一组典型的Java基准程序开展错误定位实证研究.结果表明:最优怀疑度计算公式Wong,Russel&Rao和Binary的错误定位效率与切片选择策略无关,而提出的怀疑度计算公式HSS,Tarantula,DStar,Naish1和Naish2在低相似度切片谱上定位效果较好.

  • 作者

    鞠小林  姜淑娟  陈翔  张艳梅  邵浩然  Ju Xiaolin  Jiang Shujuan  Chen Xiang  Zhang Yanmei  Shao Haoran 

  • 作者单位

    中国矿业大学计算机科学与技术学院 江苏徐州 221116;南通大学计算机科学与技术学院 江苏南通 226019/中国矿业大学计算机科学与技术学院 江苏徐州 221116/南通大学计算机科学与技术学院 江苏南通 226019

  • 刊期

    2014年12期 ISTIC EI PKU

  • 关键词

    程序调试  错误定位  切片谱  怀疑度计算  错误诊断  program debugging  fault localization  slice spectrum  suspiciousness evaluation  fault diagnosis 

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